Thursday, 11 November 2004 - 11:40 AM
127

This presentation is part of: Analytical Chemistry I (General Session)

Use of surface confined electrochemically active ruthenium polypyridyl phosphates as probes for indium tin oxide (ITO) thin film quality

Christopher K. Njue, Shaw University, Raleigh, NC and Edmond F. Bowden, North Carolina State University, Raleigh, NC.

Performance of ITO based devices is closely related to the quality of ITO. As such, the increasing global use of ITO based devices coupled with the widely documented ITO quality variability has led to a need for reliable and rapid ITO characterization methods. One key to the variability of ITO quality could lie in the chemical type and form of the surface oxide groups. A discussion of how the chemistry of surface oxides can be utilized to give some insight into the quality of the ITO will be presented. Conditions are established under which strong binding of phosphate modified ruthenium polypyridyl complexes coupled with the electrochemistry of Ru (II)/ Ru (III) redox couple are utilized to report on the relative amounts of available surface reactive oxide groups on ITO. As an example two different batches of ITO were distinguished from each other.

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