This instrument is based on Multiple Light Scattering (MLS) and is associated to a vertical scanning of the sample. It is like a high resolution electronic eye, enabling to identify and quantify instability phenomena before they are visible to the operator (5 to 50 times earlier than the naked eye). Physical parameters and kinetics can be computed in order to facilitate and improve comparisons between formulations. Moreover, it is possible to use the information contained in the MLS signal to extract parameters such as particle mean diameter without the need of dilution, as often required with diffraction techniques based on single scattering models. This measurement can be done on the finished product or, in real time, during the process.