We demonstrate the power of integration of optical microscopy and spectroscopy with Atomic Force Microscope. NT-MDT Ntegra Spectra instrument integrates Atomic Force Microscope, SNOM, optical microscope and confocal Raman/fluorescence microscope into one measurement platform controlled by a single piece of software. It becomes possible to perform all optical and all AFM measurements on the same place of the sample or on the same object – even if this object is of a nanometer scale. Thus, physical characterization properties of AFM merge with chemical resolution of confocal Raman microscope and general capabilities of optical microscope. Physical and chemical properties of various objects are characterized: carbon nanotubes, cells, silicon structures etc. We also study waveguiding properties of semiconductor and polymer nanofibers of different sizes and materials. Light of different wavelengths is injected into an individual nanofiber and is partially transmitted through it. Spectra of transmitted light are analyzed. The ultimate goal of integrating AFM with optics is to bring resolution of optical methods (mainly, Raman and fluorescence) down to resolution of AFM (a few nm). We demonstrate how the light interaction with the apex of AFM cantilever produces an optical signal originated from a substantially subwavelength sample area located right below apex of AFM probe. By scanning the AFM probe along the sample, getting 2D maps of Raman or fluorescence signals with subwavelength resolution (down to a few dozens of nm) becomes possible.