This presentation will survey some significant new particle characterization developments of recent years along with their driving forces and then will examine one specific advance in more detail, the development of new techniques and instrumentation to extract more highly detailed particle size distribution information from a laser light scattering pattern than previously available using Mie Theory. We will show that there is a great deal more information about particle sizes in the light scattering pattern than prior technologies have been able to access. Instrumentation will be presented that is capable of a level of performance previously unavailable.