Sunday, June 29, 2008: 1:00 PM-5:00 PM
Diamond II (Sheraton Burlington Hotel and Conference Center)
Scanning Probe Microscopy In Modern Nanotechnology I
Scanning Probe microscopy (SPM) is one of the (if not the) major tools responsible for the development of what is called nowadays Nanoscience and Nanotechnology. The unique combination of 3D resolution, easy operation, and broad range of samples it can work with, makes this technique of choice in many applications. Recently, a whole spectrum of SPM techniques has been developed to study surfaces beyond just simple imaging. Measuring specific interaction forces between specimen surface and a sharp SPM probe, one can collect information on electrical, magnetic properties, thermal conductivity, elasticity, and chemical structure of the surface down to the nanoscale resolution.
Sponsor: ACS Division of Colloid and Surface Chemistry (COLL)
Presider:Nancy A. Burnham
Organizer:Igor Sokolov
1:00 PM13General Introduction
Igor Sokolov
1:05 PM14Measuring Molecular Forces with Ultrasmall-Amplitude AFM
Peter M. Hoffmann
1:35 PM15Local Thermomechanical Characterization of Phase Transitions in Polymers Using Band Excitation Atomic Force Acoustic Microscopy with Heated Probe
Maxim Nikiforov, Peter Maksymovych, Stephen Jesse, Nina Balke, Arthur P. Baddorf, Ramamoorthy Ramesh, Mark Huijben, Sergei V. Kalinin
2:05 PM16Low-Wear Variable-Slope Method of Lateral Force Calibration
Saonti Chakraborty, Derek Eggiman, Colin DeGraf, Keeley Stevens, Deli Liu, Nancy A. Burnham
2:25 PM17Adhesion Forces Between Polymer Surfaces and Self-Assembled Monolayers Investigated by Atomic Force Microscopy
Jagdeep Singh, James E. Whitten
2:45 PM Break
3:15 PM18Detection of Process-Induced Dielectric Constant Gradients In Low K Dielectric Materials
Todd Gross
3:45 PM19Does Continuum Mechanics Break down In Interpreting Nanoscale Adhesion Data?
Nancy A. Burnham
4:15 PM20AFM Method of Measurement of Adhesion of Ceria Nanoparticles to Silica Wafers
Dmitro Volkov
4:35 PM21Influence of the Roughness Exponent on Adhesion
Deli Liu, Jack Martin, Nancy A. Burnham

Back to The Northeast Regional Meeting (NERM) (June 29 - July 2, 2008)