Near-field Scanning Optical Microscopy (NSOM) is powerful technique, which allows optical imaging and spectroscopy with resolution below diffraction limit. We are presenting the way of using photoluminescent silicon nitride AFM tip as a light source for the apertureless near-field microscopy. When such tip is illuminated with evanescent wave, generated by ultraviolet laser, it emits light in broad range 450-750 nm from the tip end, making it true point light source. No bleaching or lenking of such source was detected. Compare to the optical fiber NSOM photoluminescent light source has higher brightness and low cost. NSOM using such photoluminescent light source does not need probe dithering with future signal demodulation as in standard apertureless NSOM configuration, and shows absence of interference fringes due to excitation/emission incoherence. High-resolution optical images of metal and protein nanostructures show practical application of such novel NSOM probe. Also we are discussing the way to produce different photoluminescent light sources with tunable color, brightness and spectral shape for high-resolution optical studies and surface spectroscopy