The future of nanotechnology requires the creation of nanoscale building blocks with precisely specified properties. Lithography will be a key technology for implementing the specification but much fundamental work on the interfacial properties of materials is required before it is known exactly what properties are to be impressed onto the sample. To that end, this talk will cover two new techniques developed for elucidating interfacial properties using the Atomic Force Microscope. First, Brownian Force Profile Reconstruction harnesses the thermal motion of the cantilever to accurately and precisely reconstruct equilibrium force profiles. Complete information about equilibrium force profiles will aide in the design of self-assembling systems. Experiments revealed the energetics and structure of water between solvated hydroxyl terminated self-assembled monolayers. Second, Tapping Mode Force Profile Reconstruction computes the forces experienced by the advancing and receding tip during high frequency oscillation. Hysteresis between these traces reveals sources of energy dissipation during tip-sample interaction. Investigation of solvated hydrophilic surfaces revealed slow reordering dynamics in electrostatic doubles layers and fast reordering for less long range interactions.