312 Ion Mobility - Soft-Landing for the Production and Characterization of Metal Clusters

Thursday, November 5, 2009: 10:50 AM
Angus (Camino Real Hotel)
Stephen Davila , Department of Chemistry, University of North Texas, Denton, TX
David Birdwell , Department of Chemistry, University of North Texas, Denton, TX
Guido F. Verbeck , Department of Chemistry, University of North Texas, Denton, TX
Ion Mobility Spectrometry (IMS) has been around for more than a quarter century, with applications ranging from portable chemical analyzers to tandem instruments by coupling IMS to mass spectrometry creating a multifaceted instrument capable of a wide array of analyses. A novel development in preparative material instrumentation is a recently designed and developed soft-landing instrument utilizing IMS to isolate and thermalize desired ions for preparative purposes. The laser ablation of Cu by an Nd:YAG 1064/532 nm laser in the presence of He provides a source of Cun clusters, and a unique split-ring ion optic allows us to control which cluster is deposited on the surface. The deposition of the clusters on the surface are characterized via Atomic Force Microscopy and/or Raman Spectroscopy verifying deposition and characterizing unique deposition/assembly features specific to the clusters. This novel soft-landing instrument is not limited to the formation and study of metal clusters. The availability of alternate ionization sources allows us to couple them with ion mobility for future development and characterization of soft-landed substrates.